Analysis of wrapped or cased object by a hand-held X-ray fluorescence spectrometer
Analysis of wrapped or cased object by a hand-held X-ray fluorescence spectrometer
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DOI：
10.1016/j.forsciint.2005.02.017
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发表时间：
2005-07-16
影响因子：
2.2
通讯作者：
Kawai, J
中科院分区：
文献类型：
--
作者：
Ida, H;Kawai, J
金属、合金和有毒食品用手持式X射线荧光光谱仪进行分析，在这些物体和光谱仪之间插入屏蔽（包装或外壳材料），以检查分析包装内容物的可能性。在对象中检测到Fe、Cr、Ni、Cu、Zn、Ph、Mo和As等元素。随着屏蔽厚度的增加，物体中每种元素的荧光强度呈指数下降，下降的程度取决于屏蔽材料和荧光X射线的能量。当物体是铁或铅时，屏蔽的厚度可以通过使用强度比Fe K β/K α或Pb L β/L α来计算，或者通过使用入射X射线的康普顿散射的强度来计算。可以利用所获得的屏蔽的厚度来估计对象中的元素的原始峰值强度，即没有屏蔽的强度。因为原始峰值强度是使用屏蔽厚度的指数函数计算的，所以强度比的计算，例如黄铜的Zn K α/Cu K α，对于消除屏蔽厚度的估计误差是有效的。利用康普顿散射强度可以估算黄铜和钢的成分，误差小于30%。(c)2005爱思唯尔爱尔兰有限公司保留所有权利。
Metals, alloys, and poisoned food were analyzed with a hand-held X-ray fluorescence (XRF) spectrometer, with a shield (wrapping or casing material) inserted between these objects and the spectrometer, in order to examine the possibility of analyzing the contents of packages. Elements such as Fe, Cr, Ni, Cu, Zn, Ph, Mo, and As were detected in the objects. The fluorescent intensity of each element in the object decreased exponentially as the thickness of the shield increased, and the degree of decrease depended on both the material of the shield and the energy of fluorescent X-rays. The thickness of the shield can be calculated by using the intensity ratio Fe K beta/K alpha or Pb L beta/L alpha when the object is iron or lead, or by using the intensity of the Compton scattering of incident X-rays. The original peak intensity, i.e. intensity without a shield, of an element in an object can be estimated with the thickness of the shield obtained. Because the original peak intensity is calculated using an exponential function of the thickness of the shield, calculation of the intensity ratio, e.g. Zn K alpha/Cu K alpha for brass, is effective for cancelling the estimation error for the thickness of the shield. The composition of brass and steel can be estimated with an error of less than 30% by using the intensity of the Compton scattering. (c) 2005 Elsevier Ireland Ltd. All rights reserved.