Crystal structure, thermal expansion and electrical properties of a new compound HoAl0.34Ge2
Crystal structure, thermal expansion and electrical properties of a new compound HoAl0.34Ge2
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DOI:
10.1016/j.matchemphys.2008.07.008
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发表时间:
2008-12
影响因子:
4.6
通讯作者:
L. Zeng;Pingli Qin;Ye Chen;Hongrui Liu;Wei He;Liangqin Nong
中科院分区:
文献类型:
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作者:
L. Zeng;Pingli Qin;Ye Chen;Hongrui Liu;Wei He;Liangqin Nong
A new ternary compound HoAl0.34Ge2has been synthesized and studied from 298K to 773K by means of X-ray powder diffraction technique. The crystal structure of HoAl0.34Ge2has been determined by using Rietveld method. The ternary compound HoAl0.34Ge2crystallizes in the orthorhombic defect CeNiSi2structure type (space group Cmcm, a=0.40905(1)nm, b=1.61575(5)nm, c=0.39395(1)nm, Z=4 and Dcalc=8.145gcm−3). The average thermal expansion coefficients α¯a, α¯band α¯cof HoAl0.34Ge2are 1.89×10−5K−1, 0.87×10−5K−1and 1.59×10−5K−1, respectively. The average coefficient of bulk thermal expansion α¯Vis 4.25×10−5K−1. Electrical resistivity of HoAl0.34Ge2was measured between 5K and 300K. It shows metallic-like behavior of conductivity in the investigated temperature range.