Ultrashort-pulse interferometric sensors for optical shape and deformation measurement
Ultrashort-pulse interferometric sensors for optical shape and deformation measurement
复制标题
用于光学形状和变形测量的超短脉冲干涉传感器
DOI：
10.1117/12.445537
复制
发表时间：
2001
期刊：
影响因子：
--
通讯作者：
T. Carlsson
中科院分区：
文献类型：
--
作者：
T. Carlsson
本文叙述了超短脉冲激光干涉测量的基本原理。不同的干涉仪配置作为光学形状和变形测量的传感器进行了讨论。主要讨论的传感器结构有：非扫描白光干涉仪作为距离和脉冲长度传感器。超短脉冲散斑干涉法用于三维面形测量。利用全息术记录飞行中的光，用于光传播的可视化和三维形状测量。用全息术进行数字光飞行记录。超短脉冲全息干涉计量术。
Basic principles for interferometry with ultrashort-pulse lasers are described. Different interferometer configurations for use as sensors for optical shape and deformation measurement are discussed. The sensor configurations that are mainly treated, are: the non-scanning white-light interferometer as distance and pulse length sensor. Speckle interferometry with ultrashort pulses for three-dimensional shape measurement. Light-in-flight recording by holography for visualization of light propagation and for three-dimensional shape measurement. Digital light-in-flight recording by holography. Holographic interferometry with ultrashort pulses.