Elimination of self-absorption in fluorescence hard-x-ray absorption spectra
Elimination of self-absorption in fluorescence hard-x-ray absorption spectra
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DOI：
10.1103/physrevb.60.9335
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发表时间：
1999-10
影响因子：
3.7
通讯作者：
P. Pfalzer;J. Urbach;M. Klemm;S. Horn;M. Denboer;A. Frenkel;J. Kirkland
中科院分区：
文献类型：
--
作者：
P. Pfalzer;J. Urbach;M. Klemm;S. Horn;M. Denboer;A. Frenkel;J. Kirkland
在无法按所需配置制作样品的情况下，荧光检测是测量X射线吸收光谱的一种便捷方法。然而，自吸收效应会对荧光测量的光谱造成相当大的失真。我们描述了一种简单的方法来利用已知的X射线吸收系数的能量依赖关系来校正硬X射线区域中的这种失真。用这种方法得到了单晶V{sub2}O{sub3}的V{italK}边谱，证明了自吸收得到了正确的修正。这便于即使在硬X射线区域中也使用荧光检测。{版权所有}{ital1999}{italthe American Physitive Society}
Fluorescence detection is a convenient way to measure x-ray absorption spectra in situations where samples cannot be made in the required configuration. However, self-absorption effects cause considerable distortion of spectra measured in fluorescence. We describe a straightforward procedure to correct for such distortion in the hard-x-ray region using the known energy dependence of the x-ray absorption coefficients. This procedure is used to obtain the vanadium {ital K}-edge spectrum of single crystal V{sub 2}O{sub 3} and we demonstrate that self-absorption is properly corrected. This facilitates the use of fluorescence detection even in the hard-x-ray region. {copyright} {ital 1999} {ital The American Physical Society}