Comparative study between Si(110)and(100)substrates on mobility and velocity enhancements for short-channel highly-strained PFETs

Comparative study between Si(110)and(100)substrates on mobility and velocity enhancements for short-channel highly-strained PFETs
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Si(110) 和 (100) 衬底对短沟道高应变 PFET 迁移率和速度增强的比较研究

DOI:
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发表时间:
2009
期刊:
Symposium on VLSI Technology, Digest of Technical Papers
影响因子:
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通讯作者:
Satoru Mayuzumi
Satoru Mayuzumi
中科院分区:
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文献类型:
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作者:
正木了;他7名;Satoru Mayuzumi

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