Electrical Characterization of Solar Cell Materials Using Scanning Probe Microscopy
Electrical Characterization of Solar Cell Materials Using Scanning Probe Microscopy
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DOI：
10.1007/978-3-642-25414-7_19
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
S. Weber;H. Butt;R. Berger
中科院分区：
文献类型：
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作者：
S. Weber;H. Butt;R. Berger
电模式在扫描探针显微镜中的应用对于理解纳米尺度上结构化材料的电功能和相互作用具有突出的重要性。许多研究人员使用扫描探针显微镜（SPM）进行表面形貌的研究。在这里，我们强调使用的电模式是唯一的结构和电信息的相关性在纳米尺度上。这对于分析无机和有机太阳能电池配置特别重要。我们将介绍SPM模式，使表面电位，电导，或在表面的局部光电流的研究。然后，我们回顾了这些模式的光伏能源材料中的纳米电功能的可视化应用。特别关注的是实验，旨在调查光诱导的过程，这需要一个额外的光源集成到SPM设置。最后，我们解决未来的挑战SPM能源材料，先进的样品制备，以及即将到来的和可能的未来发展的电SPM模式的调查。
The application of electrical modes in scanning probe microscopy is of eminent importance for understanding the electrical function and interaction of materials that are structured on the nanometer scale. Many researchers use the scanning probe microscope (SPM) for the investigation of surface topography. Here, we accentuate the use of electrical modes that are unique for the correlation of structural and electric information on a nanometer scale. This is particularly important for analyzing inorganic and organic solar cell configurations. We will introduce SPM modes that enable the study of surface potentials, electrical conductance, or local photocurrents at surfaces. Then, we review applications of these modes for the visualization of nanoscale electrical functions in photovoltaic energy materials. Special focus is given to experiments aiming at the investigation of light-induced processes which requires the integration of an additional light source into the SPM setup. Finally, we address future challenges for SPM investigation of energy materials, advanced sample preparation, and upcoming and possible future developments of electrical SPM modes.