Embedded deterministic test points for compact cell-aware tests
Embedded deterministic test points for compact cell-aware tests
复制标题
用于紧凑的细胞感知测试的嵌入式确定性测试点
DOI：
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发表时间：
2015
期刊：
影响因子：
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通讯作者：
Justyna Zawada
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文献类型：
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作者：
Cesar Acero;D. Feltham;F. Hapke;Elham K. Moghaddam;N. Mukherjee;Vidya Neerkundar;M. Patyra;J. Rajski;J. Tyszer;Justyna Zawada
FinFET技术的引入加速了针对单元内部缺陷的模式的采用，例如单元感知测试。尽管从筛选的角度来看，细胞感知测试可以取代固定和过渡模式，但我们必须解决测试数据量增加的问题。再加上新技术节点支持的门数不断增加，这就推动了对更高压缩级别的需求。在本文中，我们提出了一种新的测试点技术，旨在减少确定性模式计数的细胞感知测试。该技术基于识别和解决内部信号之间的冲突，使ATPG能够显著增加单个模式所针对的故障数量。在多个工业设计上的测试压缩实验结果表明，所提出的测试点对于1周期和2周期细胞感知模式的压缩平均可实现3×-4×的乘法增长。
The introduction of FinFET technology has accelerated the adoption of patterns that target cell internal defects such as cell-aware tests. Even though cell-aware tests can replace stuck-at and transition patterns from the screening point of view, we have to address the increase in test data volume. This combined with the growing gate counts enabled by new technology nodes is driving the need for even greater compression levels. In this paper, we present a novel test points technology designed to reduce deterministic pattern counts for cell-aware tests. The technology is based on identification and resolution of conflicts across internal signals allowing ATPG to significantly increase the number of faults targeted by a single pattern. Experimental results on a number of industrial designs with test compression demonstrate that the proposed test points are effective in achieving, on average, a 3×-4× multiplicative increase in compression for 1-cycle and 2-cycle cell-aware patterns.