A Scanning Transmission Electron Microscopy Investigation of Grain‐Boundary Segregation in a ZnO‐Bi2O3 Varistor
A Scanning Transmission Electron Microscopy Investigation of Grain‐Boundary Segregation in a ZnO‐Bi2O3 Varistor
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ZnO-Bi2O3 压敏电阻晶界偏析的扫描透射电子显微镜研究
DOI：
10.1111/j.1151-2916.1979.tb19064.x
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发表时间：
1979
影响因子：
3.9
通讯作者：
T. Mitamura
中科院分区：
文献类型：
--
作者：
W. Kingery;J. B. Sande;T. Mitamura
用扫描电子显微镜(STEM)观察到析出粒子，发现与基体相比，析出物中的铋含量较高。在晶界附近有一个铋偏析区域，所有晶界上的铋浓度都有所增加。(FS)
Precipitate particles were observed by (STEM) and found to have a Bi content relative to the matrix. There is a region of Bi segregation adjacent the boundary and there is an enhanced Bi concentrations at all grain boundaries. (FS)