Limiting-path model of the critical current in a textured YBa2Cu3O7- delta film.
Limiting-path model of the critical current in a textured YBa2Cu3O7- delta film.
复制标题
织构 YBa2Cu3O7-δ 薄膜中临界电流的极限路径模型。
DOI：
10.1103/physrevb.40.829
复制
发表时间：
1989
期刊：
影响因子：
--
通讯作者：
Blatter
中科院分区：
文献类型：
--
作者：
Rhyner;Blatter
本文提出了一个确定多晶超导体临界电流的极限路径模型，该模型允许精确地计算给定晶粒间耦合的临界电流，并用于确定YBa/sub 2/Cu/sub 3/O/sub 7/minus//delta/薄膜中临界电流密度与纵向织构的关系。与单晶体相比，未织构化材料的临界电流密度被抑制了1/30，并且只有通过强的轴织构化才能显著提高到5/度以内。Anontrivial长度依赖性的临界电流密度被发现为longpolycrystalwire。
A limiting-path model for the determination of the critical current in apolycrystalline superconductor is presented which allows for the exactcalculation of the critical current given the individual intergrain couplings.The model is used to determine the /ital a/-axis texturing dependence of thecritical-current density in a /ital c/-axis--oriented polycrystallineYBa/sub 2/Cu/sub 3/O/sub 7/minus//delta// film. Thecritical-current density in untextured material is suppressed by a factor of/congruent/(1/30 as compared to the single-crystal value and can beraised considerably only by strong /ital a/-axis texturing to within 5/degree/). Anontrivial length dependence of the critical-current density is found for longpolycrystalline wires.