NSEU impact on commercial avionics
NSEU impact on commercial avionics
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NSEU 对商业航空电子设备的影响
DOI：
10.1109/irps.2009.5173249
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发表时间：
2009
期刊：
影响因子：
--
通讯作者：
M. Dion
中科院分区：
文献类型：
--
作者：
David C. Matthews;M. Dion
众所周知，中子单粒子翻转(NSEU)对现代集成电路在典型地面应用中的应用有重大影响。当IC用于40,000英尺高空飞行的航空电子设备时，由于大气中的中子通量较高，并且可能对人类安全造成严重影响，这种影响的频率和危害性都在数量级上。随着集成电路变得更敏感，以及系统使用更多的位，系统也变得更加敏感。航空电子制造商使用各种方法来管理NSEU的影响，从设计开始，到产品评估过程，再到延长产品的现场寿命。
Neutron Single Event Upsets (NSEU) are known to have a significant impact on modern IC's used in typical ground applications. The impact is orders of magnitude more frequent and critical when IC's are used in avionics flying at 40,000 ft due to the higher atmospheric neutron flux and the potential for critical impact to human safety. As ICs become more sensitive and as systems use more bits, the systems become more sensitive. Avionics manufacturers use a variety of methods to manage the effects of NSEU, starting in design, through the product assessment process, and into the extended field life of products.