Measurement of Dielectric Anisotropy of Microwave Substrates by Two-resonator Method with Difierent Pairs of Resonators
Measurement of Dielectric Anisotropy of Microwave Substrates by Two-resonator Method with Difierent Pairs of Resonators
复制标题
不同谐振器对的双谐振器法测量微波基片的介电各向异性
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
V. P. Levcheva
中科院分区：
文献类型：
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作者：
P. Dankov;B. Hadjistamov;Iliyana P. Arestova;V. P. Levcheva
本文研究了用双谐振腔法测量平面射频基片的介电常数和损耗角正切各向异性。讨论了分别测量平行于和垂直于基片表面的这些参数的原理，通过三对腔测量谐振器，基于圆柱，凹腔，分裂圆柱和分裂柱介质谐振器。已知材料的测量各向异性的例子。
The measurement of the dielectric constant and loss tangent anisotropy of the planar RF substrates by the two-resonator method is considered in this paper. The principles of the separate determination of these parameters parallel and perpendicular to the substrate surface is discussed by three pairs of cavity measurement resonators, based on cylinder, reentrant, split cylinder and split post dielectric resonators. Examples of the measured anisotropy of known materials are presented.