Defect dynamics in active nematics
Defect dynamics in active nematics
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DOI：
10.1098/rsta.2013.0365
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发表时间：
2014-11-28
期刊：
影响因子：
5
通讯作者：
Marchetti, M. Cristina
中科院分区：
文献类型：
--
作者：
Giomi, Luca;Bowick, Mark J.;Marchetti, M. Cristina
拓扑缺陷是液晶的独特特征。它们深刻地影响流体的粘弹性行为，通过约束定向结构的方式，不可避免地需要全局变化无法实现任何一组局部变形。在有源双折射液晶中，拓扑缺陷不仅决定指向矢的全局结构，而且还作为局部运动源，表现为自推进粒子。在这篇文章中，我们提出了一个详细的分析和数值研究的拓扑缺陷的机制，在有源液晶。
Topological defects are distinctive signatures of liquid crystals. They profoundly affect the viscoelastic behaviour of the fluid by constraining the orientational structure in a way that inevitably requires global changes not achievable with any set of local deformations. In active nematic liquid crystals, topological defects not only dictate the global structure of the director, but also act as local sources of motion, behaving as self-propelled particles. In this article, we present a detailed analytical and numerical study of the mechanics of topological defects in active nematic liquid crystals.