Formation of Inert Bi2Se3(0001) Cleaved Surface
Formation of Inert Bi2Se3(0001) Cleaved Surface
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DOI:
10.1021/cg201163v
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发表时间:
2011-12-01
影响因子:
3.8
通讯作者:
Tereshchenko, O. E.
中科院分区:
文献类型:
--
作者:
Atuchin, V. V.;Golyashov, V. A.;Tereshchenko, O. E.
A high quality inclusion-free Bi2Se3 crystal has been grown by the Bridgman method with the use of a rotating heat field. A large-area atomically flat Bi2Se3(0001) surface of excellent crystallographic quality has been formed by cleavage. Chemical and microstructural properties of the surface have been evaluated with reflection high-energy electron diffraction, atomic force microscopy (AFM), scanning tunneling microscopy (STM), spectroscopic ellipsometry, and X-ray photoelectron spectroscopy. There was no Bi2Se3(0001) surface oxidation detected after over a month in air under ambient conditions as shown by comparative core level spectroscopy, AFM, and STM.