Fast bi-exponential fluorescence lifetime imaging analysis methods
Fast bi-exponential fluorescence lifetime imaging analysis methods
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DOI：
10.1364/ol.40.000336
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发表时间：
2015-02-01
期刊：
影响因子：
3.6
通讯作者：
Chen, Yu
中科院分区：
文献类型：
--
作者：
Li, David Day-Uei;Yu, Hongqi;Chen, Yu
提出了一种新的硬件友好的双指数荧光寿命成像（FLIM）算法。与传统的FLIM软件相比，所提出的算法是非迭代的，直接计算寿命，因此适合于实时应用。它们适用于单通道或二维多通道时间相关单光子计数（TCSPC）系统。所提出的方法已经过测试的合成和现实的FLIM数据，我们已经比较了它们的性能与其他最近提出的非拟合双指数技术，在未来的大规模固态TCSPC成像器显示出良好的应用前景。(C)2015美国光学学会
A new hardware-friendly bi-exponential fluorescence lifetime imaging (FLIM) algorithm has been proposed. Compared to conventional FLIM software, the proposed algorithms are noniterative offering direct calculation of lifetimes and therefore suitable for real-time applications. They are applicable to single-channel or 2D multichannel time-correlated single-photon counting (TCSPC) systems. The proposed methods have been tested on both synthesized and realistic FLIM data, and we have compared their performances with other recently proposed nonfitting bi-exponential techniques showing promising applications in future massive solid-state TCSPC imagers. (C) 2015 Optical Society of America