Experimental study on thickness-related electrical characteristics in organic/metal-nanocluster/organic systems
Experimental study on thickness-related electrical characteristics in organic/metal-nanocluster/organic systems
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DOI：
10.1063/1.2033142
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发表时间：
2005-09
影响因子：
3.2
通讯作者：
S. Pyo;Liping Ma;Jun He;Qianfei Xu;Yang Yang-Yang;Yongli Gao
中科院分区：
文献类型：
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作者：
S. Pyo;Liping Ma;Jun He;Qianfei Xu;Yang Yang-Yang;Yongli Gao
通过改变有机层和金属纳米团簇层的厚度，系统地研究了具有有机/金属纳米团簇/有机三层结构的插入在两个电极之间的有机电致变色器件。以这种方式制造的器件表现出电双稳态或电流阶跃，具体取决于金属纳米团簇层的厚度。已经通过将金属纳米团簇层厚度固定在20 nm并且将有机层厚度从20 nm改变到60 nm来研究电致变色器件。器件在导通状态下的注入电流随着有机层厚度的增加呈指数下降，表明器件的电子透射概率随着有机层厚度的增加而降低。这与基于单带Hubbard模型的理论计算相一致。电流阶跃的演变被观察到的有机层厚度固定在50 nm，并通过改变电流阶跃的器件。
Organic bistable devices with the trilayer structure, organic/metal-nanocluster/organic, interposed between two electrodes have been systematically studied by varying the thickness of the organic layers and the metal-nanocluster layer. Devices fabricated in this fashion exhibit either electrical bistability or current step, depending on the thickness of the metal-nanocluster layer. Electrical bistable devices have been studied by fixing the metal-nanocluster layer thickness at 20 nm and changing the organic-layer thickness from 20 to 60 nm. Device injection current at the on state shows an exponential decrease with an increasing organic-layer thickness, suggesting that the electron transmission probability of the devices decreases with an increasing thickness of the organic layer. This is in agreement with theoretical calculations based on the single-band Hubbard model. The evolution of the electrical current step is observed for devices fabricated by fixing the organic-layer thickness at 50 nm and changi...