Generation of test sequences from formal specifications: GSM 11‐11 standard case study
Generation of test sequences from formal specifications: GSM 11‐11 standard case study
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根据正式规范生成测试序列:GSM 11‐11 标准案例研究
DOI:
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发表时间:
2004
期刊:
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通讯作者:
F. Peureux
中科院分区:
文献类型:
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作者:
Eddy Bernard;B. Legeard;Xavier Luck;F. Peureux
This paper presents the results of a case study on generating test cases for a fragment of the smart card GSM 11‐11 standard. The generation method is based on an original approach using the B notation and techniques of constraint logic programming with sets. The GSM 11‐11 technical specifications were formalized with the B notation. From this B specification, a system of constraints was derived, equivalent to this formal model. Using a set constraint solver, boundary states were computed and test cases were obtained by traversing the constrained reachability graph of the specifications. The purpose of this project was to evaluate the contribution of this testing environment, called B‐TESTING‐TOOLS, in an industrial process on a real life‐size application, by comparing the generated test sequences with the already used and high‐quality manually‐designed tests. This comparison enabled us to validate our approach and showed its effectiveness in the validation process of critical applications: the case study gives a wide coverage (about 85%) of the generated tests compared to the pre‐existing tests and a saving of 30% in test design time. Copyright © 2004 John Wiley & Sons, Ltd.