Investigation of defect states in light-irradiated single-crystal ZnO by low-temperature positron annihilation lifetime spectroscopy
Investigation of defect states in light-irradiated single-crystal ZnO by low-temperature positron annihilation lifetime spectroscopy
复制标题
利用低温正电子湮灭寿命光谱研究光照射单晶 ZnO 中的缺陷态
DOI:
10.35848/1347-4065/ac9103
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发表时间:
2022
影响因子:
1.5
通讯作者:
Kuriyama Kazuo
中科院分区:
文献类型:
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作者:
Nakajima Makoto;Kinomura Atsushi;Yabuuchi Atsushi;Kuriyama Kazuo