Fast ion ripple losses during neutral injection in TFR
Fast ion ripple losses during neutral injection in TFR
复制标题
TFR 中性注入期间的快速离子纹波损失
DOI：
10.1088/0029-5515/28/3/014
复制
发表时间：
1988
期刊：
影响因子：
3.3
通讯作者：
J. Roubin
中科院分区：
文献类型：
--
作者：
M. Tuszewski;J. Roubin
在TFR中性束注入过程中的快离子涟漪损失的近定量测量与法拉第收集器阵列安装在两个环向场线圈之间。所收集的电流显示出快速离子涟漪损失的多个证据，并且对应于注入电流的30-40%的全局损失。测量结果由一个简单的福克-普朗克模型补充，该模型本身在几种情况下与蒙特卡洛模拟进行了检查。这些计算澄清了许多实验特征，但仅预测了所观察到的涟漪损失电流的一半左右。这种差异可能部分是由于各种实验和理论的不确定性，虽然有迹象表明，在实验中的一些增强的涟漪损失。这种损失可能是由计算中未包括的环向场涟漪以外的其他过程引起的，并且可能表明，沿着其他诊断，中心快离子的增强耗尽，其起源仍不清楚。快速离子涟漪损失的计算和观察是相当不敏感的因素，在大多数等离子体参数的两个变化。只有当近垂直注入边缘涟漪≥ 1%的托卡马克等离子体时，才能预测到大量的损失。快速离子涟漪损失在几个设备被认为是和计算TORE SUPRA。
Fast ion ripple losses during neutral beam injection in TFR are measured near-quantitatively with an array of Faraday collectors mounted between two toroidal field coils. The collected currents show multiple evidence for fast ion ripple losses and correspond to global losses of 30-40% of the injected current. The measurements are complemented by a simple Fokker-Planck model, itself checked against Monte Carlo simulations on several cases. These calculations clarify many experimental features but predict only about half of the observed ripple lost current. This discrepancy could be due in part to various experimental and theoretical uncertainties although there are indications of some enhanced ripple losses in the experiments. Such losses could arise from other processes than toroidal field ripple not included in the calculations and may suggest, along with other diagnostics, an enhanced depletion of central fast ions, the origin of which remains unclear. Fast ion ripple losses are calculated and observed to be fairly insensitive to factors of two variations in most plasma parameters. Substantial losses are predicted only when injecting near perpendicularly into a tokamak plasma of edge ripple ≥1%. Fast ion ripple losses in several devices are considered and calculations for TORE SUPRA are presented.
影响因子：
3.3
作者：
A. Gibson;T. Sekiguchi;K. Lackner;S. Bodner;R. Hancox
通讯作者：
A. Gibson;T. Sekiguchi;K. Lackner;S. Bodner;R. Hancox