Measuring and imaging nanomechanical motion with laser light
Measuring and imaging nanomechanical motion with laser light
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DOI：
10.1007/s00340-016-6585-7
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发表时间：
2017-01-01
影响因子：
2.1
通讯作者：
Schliesser, Albert
中科院分区：
文献类型：
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作者：
Barg, Andreas;Tsaturyan, Yeghishe;Schliesser, Albert
我们讨论了几种基于激光驱动干涉仪和腔来测量纳米机械运动的技术。随着复杂性的增加，它们的灵敏度从热位移幅度（通常在皮米级）一直达到量子范围，其中辐射压力引起与探测光的量子涨落相关的运动。我们表明，扫描激光干涉测量很容易提供成像模式，灵敏度达到 10 fm/Hz(1/2) 量级，横向分辨率低至 2 μm。我们将这种方法与通用性较差但速度更快（单次）的暗场成像技术进行比较。
We discuss several techniques based on laserdriven interferometers and cavities to measure nanomechanical motion. With increasing complexity, they achieve sensitivities reaching from thermal displacement amplitudes, typically at the picometer scale, all the way to the quantum regime, in which radiation pressure induces motion correlated with the quantum fluctuations of the probing light. We show that an imaging modality is readily provided by scanning laser interferometry, reaching a sensitivity on the order of 10 fm/Hz(1/2), and a transverse resolution down to 2 mu m. We compare this approach with a less versatile, but faster (single-shot) dark-field imaging technique.