Development of the in Situ Calibration Method for ITER Divertor IR Thermography

Development of the in Situ Calibration Method for ITER Divertor IR Thermography
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ITER 偏滤器红外热成像原位校准方法的开发

DOI:
10.13182/fst15-191
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发表时间:
2016
期刊:
影响因子:
--
通讯作者:
K. Itami
K. Itami
中科院分区:
--
文献类型:
--
作者:
M. Takeuchi;T. Sugie;Shigehar Takeyama;K. Itami

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摘要ITER偏滤器红外热成像技术的一个重要问题是,钨偏滤器靶的沉积、侵蚀以及温度、波长和表面粗糙度的依赖性会影响温度测量,这需要10%的准确度。因此,我们研究了ITER级钨中钨样品的发射率依赖性,并在实验室实验中使用红外激光器验证了发射率评估的原位校准方法。钨样品的发射率对1.0 ~ 5.9 μm的表面粗糙度有很强的依赖性。在双色法中,通过测量钨样品在3.35和4.67 μm两个波长处的辐射率,发现发射率比值的变化不满足测量要求。因此,需要一种发射率的现场标定方法。在22°C、100°C和400°C的温度下,使用原位校准方法评估的发射率与从钨样品的辐射率评估的发射率非常一致。因此,原位校准方法的发射率评估使用红外激光器成功地验证。在IRTh中的应用还需要做更多的工作。
Abstract An important issue for ITER divertor infrared (IR) thermography (IRTh) is that changes in the emissivity of tungsten divertor targets resulting from depositions; erosions; and dependences on temperature, wavelength, and surface roughness affect the temperature measurement, which requires an accuracy of 10%. Therefore, we investigated the emissivity dependences of tungsten samples in ITER-grade tungsten and validated the proposed in situ calibration method for emissivity evaluation by using an IR laser in laboratory experiments. The emissivity of the tungsten samples had a strong dependence on surface roughness of 1.0 to 5.9 μm. In the two-color method, by measuring the radiances of the tungsten sample in two wavelengths of 3.35 and 4.67 μm, the change of the ratio of the emissivities did not satisfy the measurement requirement. Thus, an in situ calibration method of emissivity is needed. The emissivity evaluated using the in situ calibration method was in good agreement with the emissivity evaluated from the radiance for tungsten samples at temperatures of 22°C, 100°C, and 400°C. Consequently, the in situ calibration method for emissivity evaluation using an IR laser was successfully validated. More work is needed for the application in IRTh.
DOI: 10.1016/j.jnucmat.2004.04.248
发表时间: 2004-08
影响因子: 3.1
作者:
T. Sugie;S. Kasai;M. Taniguchi;M. Nagatsu;T. Nishitani
通讯作者: T. Sugie;S. Kasai;M. Taniguchi;M. Nagatsu;T. Nishitani