Real-time imaging of atomistic process in one-atom-thick metal junctions
Real-time imaging of atomistic process in one-atom-thick metal junctions
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DOI：
10.1103/physrevb.63.073405
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发表时间：
2001-02-15
影响因子：
3.7
通讯作者：
Ugarte, D
中科院分区：
文献类型：
--
作者：
Rodrigues, V;Ugarte, D
我们提出了一个原位和时间分辨的高分辨率透射电子显微镜研究的原子过程中的最后伸长阶段的金纳米结。特别是，我们专注于悬浮链的原子，这已被证明是非常稳定的，虽然他们提出了相当长的债券（3.0-3.6埃）。一个原子厚的结是坚固的，但它们的附着点在金属表面上很容易移动，允许顶点移动或旋转。
We present an in situ and time resolved high-resolution transmission electron microscopy study of the atomistic process during the last elongation stages of gold nanojunctions. In particular, we concentrate on suspended chains of atoms, which have shown to be remarkably stable, although they present rather long bonds (3.0-3.6 Angstrom). One-atom-thick junctions are robust, but their attachment points move rather easily on the metal surface, allowing the accommodation of apex movements or rotations.