Crystal Structure Analysis of Epitaxial BiFeO3–BiCoO3 Solid Solution Films Grown by Metalorganic Chemical Vapor Deposition
Crystal Structure Analysis of Epitaxial BiFeO3–BiCoO3 Solid Solution Films Grown by Metalorganic Chemical Vapor Deposition
复制标题
DOI：
10.1143/jjap.46.6948
复制
发表时间：
2007-10
影响因子：
1.5
通讯作者：
S. Yasui;K. Nishida;H. Naganuma;S. Okamura;T. Iijima;H. Funakubo
中科院分区：
文献类型：
--
作者：
S. Yasui;K. Nishida;H. Naganuma;S. Okamura;T. Iijima;H. Funakubo
在 700 °C 下，通过金属有机化学气相沉积在 (100)SrTiO3 衬底上生长了 x = 0–0.33 的外延 (001) 取向 (1-x)BiFeO3–xBiCoO3 固溶体薄膜。通过高分辨率X射线衍射分析和拉曼光谱对薄膜的晶体结构进行了表征。晶胞体积和晶格参数随着 x 的增加而变化。 x = 0 的 BiFeO3 薄膜具有菱面体对称性，x = 0.16 和 0.21 的 BiFeO3 薄膜具有菱面体和四方对称性的混合对称性。最后，观察到 x = 0.33 的薄膜以及少量污染相的四方对称性。该结果表明，随着 x 的增加，(1-x)BiFeO3–xBiCoO3 薄膜的对称性从菱形变为四方形，类似于具有大压电响应的 Pb(Zr,Ti)O3。
Epitaxial (001)-oriented (1-x)BiFeO3–xBiCoO3 solid solution films with x = 0–0.33 were grown on (100)SrTiO3 substrates at 700 °C by metalorganic chemical vapor deposition. The crystal structure of the films was characterized by high-resolution X-ray diffraction analysis and Raman spectroscopy. Unit cell volume and the lattice parameter were changed with increasing x. The BiFeO3 film with x = 0 has rhombohedral symmetry and those with x = 0.16 and 0.21 have a mixture of rhombohedral and tetragonal symmetries. Finally, tetragonal symmetry was observed for the film with x = 0.33 together with a small amount of the contamination phase. This result suggests that the symmetry of (1-x)BiFeO3–xBiCoO3 films changed from rhombohedral to tetragonal with increasing x similarly to Pb(Zr,Ti)O3 having a large piezo response.