Compositional imaging of polymers using a field emission scanning electron microscope with a microchannel plate backscattered electron detector
Compositional imaging of polymers using a field emission scanning electron microscope with a microchannel plate backscattered electron detector
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使用带有微通道板背散射电子探测器的场发射扫描电子显微镜对聚合物进行成分成像
DOI：
10.1002/sca.4950170511
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发表时间：
2006
期刊：
影响因子：
--
通讯作者：
J. Brostin
中科院分区：
文献类型：
--
作者：
J. Brostin
将微通道板背散射电子(BSE)探测器结合到场发射扫描电子显微镜中，可以在不进行化学修饰的情况下对聚合物和其他有机相进行成分成像。在接近EII的加速电压下，当样品在没有涂层的情况下成像时，微小的原子序数差异，如存在或缺乏氧气，提供了充分的对比(Goldstein等人。1984年)。传统的电子染料为没有本征对比度的纯碳氢化合物系统提供了极好的对比度。
The incorporation of a microchannel plate backscattered electron (BSE) detector into the field emission scanning electron microscope allows compositional imaging of polymers and other organic phases to be performed without chemical modification. Small atomic number differences, such as the presence or lack of oxygen, provide ample contrast when specimens are imaged without coating at accelerating voltages close to EII (Goldstein et al. 1984). Conventional electron stains provide superb contrast for purely hydrocarbon systems that have no intrinsic contrast.