Electric and Magnetic Phenomena Studied by In Situ Transmission Electron Microscopy
Electric and Magnetic Phenomena Studied by In Situ Transmission Electron Microscopy
复制标题
原位透射电子显微镜研究电和磁现象
DOI：
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发表时间：
2008
期刊：
影响因子：
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通讯作者：
Yimei Zhu
中科院分区：
文献类型：
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作者：
J. Cumings;E. Olsson;A. Petford;Yimei Zhu
有一系列技术上重要的材料，它们对电场和磁场的响应可以决定或破坏它们在特定应用中的效用。通常，这些电和磁特性是由纳米尺度特征决定的，这些特征可以通过电子显微镜研究最有效地理解。在这里，我们提出了一个概述的透射电子显微镜的能力，用于发现有关材料的电和磁性能的信息，在操作设备的上下文中。当在显微镜观察期间操作设备时，可以获得关于动态的丰富信息，包括亚稳态和过渡态。此外，由于成像光束是带电的，它可以直接捕获有关感兴趣的设备中和周围的电场和磁场的信息。这也许与纳米材料和纳米器件研究领域的不断发展最为相关。提出了几个具体的例子，材料系统，已与这些技术进行了探讨。我们还提供了一个未来的研究方向的看法。
There is a wide array of technologically significant materials whose response to electric and magnetic fields can make or break their utility for specific applications. Often, these electrical and magnetic properties are determined by nanoscale features that can be most effectively understood through electron microscopy studies. Here, we present an overview of the capabilities for transmission electron microscopy for uncovering information about electric and magnetic properties of materials in the context of operational devices. When devices are operated during microscope observations, a wealth of information is available about dynamics, including metastable and transitional states. Additionally, because the imaging beam is electrically charged, it can directly capture information about the electric and magnetic fields in and around devices of interest. This is perhaps most relevant to the growing areas of nanomaterials and nanodevice research. Several specific examples are presented of materials systems that have been explored with these techniques. We also provide a view of the future directions for research.