Polarization properties of oblique incidence scanning tunneling microscopy-tip-enhanced Raman spectroscopy
Polarization properties of oblique incidence scanning tunneling microscopy-tip-enhanced Raman spectroscopy
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DOI：
10.1366/000370207783292109
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发表时间：
2007-12-01
影响因子：
3.5
通讯作者：
Schreiber, Joachim
中科院分区：
文献类型：
--
作者：
Picardi, Gennaro;Nguyen, Quang;Schreiber, Joachim
我们使用扫描隧道显微镜尖端增强拉曼光谱（STM-TERS）来研究晶体材料以及染料吸附物上近场散射的偏振特性。最近提出的 TERS 模型很好地描述了 (111) 取向 c-Si 样品的测量结果，并且可以表征所用尖端的偏振特性。对于两种类型的样品，对于沿尖端轴具有场分量的激发辐射，尖端增强更强。垂直于尖端轴的场分量也发现了不可忽略的增强。
We used scanning tunneling microscopy-tip-enhanced Raman spectroscopy (STM-TERS) to study the polarization properties of near-field scattering on a crystalline material as well as on a dye adsorbate. The measurements on a (111)-oriented c-Si sample were found to be well described by a recently proposed model for TERS and allowed for a characterization of the polarization properties of the tips used. The tip enhancement was stronger for excitation radiation having a field component along the tip axis for both types of samples. A non-negligible enhancement was also found for the field component perpendicular to the tip axis.