Topography of retinal damage in light-exposed albino rats
Topography of retinal damage in light-exposed albino rats
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DOI：
10.1016/j.exer.2008.06.002
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发表时间：
2008-09-01
影响因子：
3.4
通讯作者：
Anderson, Robert E.
中科院分区：
文献类型：
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作者：
Tanito, Masaki;Kaidzu, Sachiko;Anderson, Robert E.
先前的研究表明，当沿着眼睛的垂直子午线测量时，上视网膜因破坏性光线照射而引起的视网膜损伤比下视网膜更严重。然而，所有视网膜区域的视网膜损伤程度尚不清楚。白化大鼠暴露在强光下（5000勒克斯，6小时），7天后摘除眼睛。沿着四个不同的经线测量外核层（ONL）厚度；颞到鼻 (T-N)、上到下 (S-I)、上颞到下鼻 (ST-IN) 和上鼻到下颞 (SN-IT)。如前所述，沿 S-I 子午线，上视网膜比下视网膜受损更严重。此外，我们发现在T-N经线上颞部视网膜比鼻部视网膜受损更严重。颜色编码的地形图清楚地显示，ONL 的变薄在视神经头上方和颞上 1-1.5 毫米处最明显，并且大多数损伤位于眼底的颞上区域。为了保持 ONL 厚度量化的一致性，使用沿 S-I 子午线切割的视网膜切片优于使用沿 T-N 子午线切割的视网膜切片，因为沿 T-N 子午线向上或向下方向的较小方向可能会导致该实验模型中测量的 ONL 厚度值发生更大的变化。 (C) 2008 Elsevier Ltd. 保留所有权利。
Previous studies have shown that retinal damage induced by damaging light exposure is more severe in superior retina than inferior retina when measured along the vertical meridian of eyes. However, the extent of retinal damage over all retinal regions is not clear. Albino rats were exposed to bright light (5000 lux for 6 h) and eyes removed 7 days later. Outer nuclear layer (ONL) thickness was measured along four different meridians; temporal-to-nasal (T-N), superior-to-inferior (S-I), superiotemporal-to-inferionasal (ST-IN), and superionasal-to-inferiotemporal (SN-IT). As reported previously, superior retina is more severely damaged than inferior retina along the S-I meridian. In addition, we found that the temporal retina is more severely damaged than nasal retina on the T-N meridian. Color-coded topographic maps clearly revealed that thinning of ONL was greatest at 1-1.5 mm superior and superiotemporal to the optic nerve head and that most damage was in the superiotemporal region of the fundus. For consistency in quantification of ONL thickness, using retinal sections cut along the S-I meridian is preferable to using those along the T-N meridian, since minor orientations to superior or inferior directions along the T-N meridian may cause greater variations in measured ONL thickness values in this experimental model. (C) 2008 Elsevier Ltd. All rights reserved.