Dark-field X-ray ptychography
Dark-field X-ray ptychography
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DOI：
10.1364/oe.23.016429
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发表时间：
2015-06-15
期刊：
影响因子：
3.8
通讯作者：
Takahashi, Yukio
中科院分区：
文献类型：
--
作者：
Suzuki, Akihiro;Takahashi, Yukio
X射线探测器的动态范围是限制X射线重叠关联成像的空间分辨率和灵敏度以及入射X射线的相干通量的关键因素。在这里，我们提出了一种高分辨率和高灵敏度的X射线重叠关联成像方法，称为“暗场X射线重叠关联成像”，它压缩了衍射图案强度的动态范围。在这种方法中，一个小的参考对象被对准样品的上游。从物体散射的X射线作为同轴全息术的参考光束。收集包括同轴全息图的重叠关联衍射图案，然后通过迭代相位法再现样品的图像。这种方法使我们能够模糊的低Q区域的衍射图案使用光束停止，因为在行全息图补充结构信息的低Q区域，导致在压缩的动态范围的强度的衍射图案。数值研究表明，衍射图样强度的动态范围减小了约三个数量级。(C)2015年美国光学学会。
The dynamic range of X-ray detectors is a key factor limiting both the spatial resolution and sensitivity of X-ray ptychography as well as the coherent flux of incident X-rays. Here, we propose a method for high-resolution and high-sensitivity X-ray ptychography named "dark-field X-ray ptychography", which compresses the dynamic range of intensities of diffraction patterns. In this method, a small reference object is aligned upstream of the sample. The scattered X-rays from the object work as a reference beam for in-line holography. Ptychographic diffraction patterns including the in-line hologram are collected, and then the image of the sample is reconstructed by an iterative phasing method. This method allows us to obscure the low-Q region of the diffraction patterns using a beamstop since the in-line hologram complements structural information in the low-Q region, resulting in the compression of the dynamic range of intensities of diffraction patterns. A numerical study shows that the dynamic range of intensities of diffraction patterns is decreased by about three orders of magnitude. (C) 2015 Optical Society of America.