A New Characterization of Line-to-line Maps in the Upper Plane

A New Characterization of Line-to-line Maps in the Upper Plane
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上层平面线对线图的新表征

DOI:
10.2298/fil1301127l
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发表时间:
2013
期刊:
影响因子:
0.8
通讯作者:
Wang, Yuefei
Wang, Yuefei
中科院分区:
数学4区
文献类型:
--
作者:
Li, Baokui;Wang, Yuefei

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在给定空间的定义域上刻画典型映射是一个比在整个空间上刻画典型映射困难得多的问题。本文利用双曲几何和仿射几何的方法,给出了上平面上线到线映射的一个新的刻划。我们证明了线到线满射是仿射变换,或者是仿射变换和仿射-反射的合成。此外,我们还证明了具有相同边界的两个双反射的合成是一个仿射变换。
The characterization of typical maps in a domain of a given space is a much harder problem than that in the whole space. In this paper, by using methods of hyperbolic and affine geometry, we give a new characterization of line-to-line maps in the upper plane. We show that a line-to-line surjection is either an affine transformation, or a composition of an affine transformation and a ɡ-reflection. Moreover, we prove that the composition of two ɡ-reflections with the same boundary is an affine transformation.
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