Burn control simulation experiments in JT-60U

Burn control simulation experiments in JT-60U
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JT-60U燃烧控制模拟实验

DOI:
10.1016/j.fusengdes.2007.07.059
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发表时间:
2007
期刊:
--
影响因子:
--
通讯作者:
R. Shimada
R. Shimada
中科院分区:
--
文献类型:
--
作者:
K. Shimomura;H. Takenaga;H. Tsutsui;H. Mimata;S. Tsuji;Y. Miura;K. Tani;H. Kubo;Y. Sakamoto;H. Hiratsuka;H. Ichige;M. Sueoka;Y. Kawamata;R. Sakamoto;S. Kobayashi;R. Shimada

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采用JT-60U中的燃烧等离子体模拟方案,在非燃烧DD等离子体中进行了燃烧控制模拟实验。在燃烧等离子体模拟方案中,使用了两个中性束(NB)组,其中一组模拟α粒子加热,另一组模拟外部加热。在 ELMy H 模式等离子体和具有内部传输势垒的反向剪切 (RS) 等离子体中,存储的能量和中子产率被控制在几乎恒定的值。在这些等离子体中,当 α 粒子加热模拟的 NB 功率减少/增加时,外部加热模拟的 NB 功率增加/减少。 RS 等离子体中外部加热模拟的 NB 功率变化大于 ELMy H 模式等离子体,表明 RS 等离子体需要更大的控制裕度。为了了解 ELMy H 模式和 RS 等离子体之间差异的详细物理机制,我们使用 1.5 维输运代码进行了数值分析。该计算表明,在 RS 等离子体中实验观察到的较大变化不能用热扩散率分布的差异或其温度依赖性来解释。
Burn control simulation experiments were conducted in non-burning DD plasmas by using a burning plasma simulation scheme in JT-60U. In the burning plasma simulation scheme, two neutral beam (NB) groups were used, where one simulates α-particle heating and the other simulates external heating. The stored energy and the neutron yield rate were controlled at nearly constant values in both ELMy H-mode plasma and reversed shear (RS) plasma with an Internal Transport Barrier. In these plasmas, the NB power for the external heating simulation increased/decreased when the NB power for the α-particle heating simulation decreased/increased. Variation of the NB power for the external heating simulation was larger in the RS plasma than that in the ELMy H-mode plasma, indicating that larger control margin is necessary for the RS plasmas. In order to understand the detailed physical mechanism for the difference between ELMy H-mode and RS plasmas, we conducted numerical analysis using a 1.5-dimensional transport code. This calculation indicates the larger variation experimentally observed in the RS plasma could not be explained by the difference of the thermal diffusivity profiles or its temperature dependence.
利用JT-60U燃烧等离子体模拟实验进行燃烧控制研究
DOI: --
发表时间: 2006
期刊: Fusion Science and Technology 50
影响因子: --
作者:
Maruyama;F.;Tani;K.;Kenzaka;T.;Yamaguchi;N.;Nasu;M.;H.Takenaga et al.
通讯作者: H.Takenaga et al.