Improved techniques for the measurement of phase error in waveguide based optical devices
Improved techniques for the measurement of phase error in waveguide based optical devices
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DOI：
10.1109/jlt.2002.803060
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发表时间：
2003
影响因子：
4.7
通讯作者：
Wei Chen-;Y. Chen;M. Yan;B. McGinnis;Zhengmao Wu
中科院分区：
文献类型：
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作者：
Wei Chen-;Y. Chen;M. Yan;B. McGinnis;Zhengmao Wu
利用非相干光源和干涉图中的信息进行相位误差测量是表征波导基光学器件的有效技术。我们提出了一种新的分析方案，利用希尔伯特变换沿着增加的数据采样率的干涉图。更高的数据采样率使测量更能容忍噪声，并将最终相位确定的精度提高到0.2/spl deg/。该技术实现了能够测试具有非常小的路径长度差异的波导的“开窗”分析方法。我们还提出了一种新的分析工具，通过创建一个“相位趋势”的绘图，检测不同的光模式在波导内传播的设备特性。
Phase-error measurement using an incoherent light source and information in the resulting interferograms is an effective technique for characterizing waveguide-based optical devices. We propose a new analysis scheme that utilizes Hilbert transformation along with an increased data sampling rate of the interferogram. The higher data sampling rate makes the measurement more noise tolerant and improves the accuracy of the resulting phase determination to 0.2/spl deg/. This technique enables a "windowing" analysis method that is capable of testing waveguides with very small path length differences. We also present a new analysis tool for device characterization by creating a "phase trend" plot that detects different optical modes propagating within the waveguide.