Dynamic Control of Temperature Distributions in Stacks of Intrinsic Josephson Junctions in Bi 2 Sr 2 CaCu 2 O 8 + δ for Intense Terahertz Radiation
Dynamic Control of Temperature Distributions in Stacks of Intrinsic Josephson Junctions in Bi 2 Sr 2 CaCu 2 O 8 + δ for Intense Terahertz Radiation
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DOI：
10.1103/physrevapplied.2.044016
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发表时间：
2014-10
影响因子：
4.6
通讯作者：
M. Tsujimoto;H. Kambara;Y. Maeda;Y. Yoshioka;Y. Nakagawa;I. Kakeya
中科院分区：
文献类型：
--
作者：
M. Tsujimoto;H. Kambara;Y. Maeda;Y. Yoshioka;Y. Nakagawa;I. Kakeya
通过动态控制Bi_2Sr_2CaCu_2O_（8-δ）台面的温度分布，研究了热斑尺寸与本征约瑟夫森结太赫兹辐射强度之间的普遍关系.与非均匀电流偏置相比，均匀电流偏置导致局部温度显著增加。发射的热响应在高偏压和低偏压制度之间不同。我们发现，在发射堆中的超导部件的体积和发射强度之间的强正相关性。我们确定了显着增加的发射强度高达20%，通过消除多余的焦耳热从梅萨。
We study the universal relationship between the hot-spot size and the intensity of terahertz emission from intrinsic Josephson junctions by dynamically controlling the temperature distributions in mesas of Bi2Sr2CaCu2O8þδ. The uniform current bias leads to a significant increase in local temperature compared to the nonuniform current bias. The thermal response of emission differs between the high- and low-bias regimes. We find a strong positive correlation between the emission intensity and the volume of the superconducting parts in the emitting stack. We identify the remarkable increase in the emission intensity by up to 20% by eliminating the excess Joule heat from the mesa.