Growth twins in nanocrystalline SnO2 thin films by high‐resolution transmission electron microscopy
Growth twins in nanocrystalline SnO2 thin films by high‐resolution transmission electron microscopy
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通过高分辨率透射电子显微镜观察纳米晶 SnO2 薄膜中的生长孪晶
DOI：
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发表时间：
1996
期刊：
影响因子：
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通讯作者：
M. Rühle
中科院分区：
文献类型：
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作者：
J. G. Zheng;Xiaoqing Pan;M. Schweizer;F. Zhou;U. Weimar;W. Göpel;M. Rühle
用高分辨透射电镜研究了5 ~ 50 nm晶粒尺寸的SnO2纳米薄膜中的生长孪晶。它们显示出{101}< 101 >的几何形状，金属原子镜像对称，以及氧原子的轻微畸变。在薄膜中经常观察到密度约为1015 m−2的多重孪晶和阶梯孪晶边界。似乎有两个插播广告，因此，电子捐赠者与插播广告有关。
Growth twins in nanocrystalline SnO2 thin films with grain size 5–50 nm have been investigated by high‐resolution transmission electron microscopy. They show the {101}〈101〉 geometry, metal atom mirror symmetry, and slight distortion of oxygen atoms. Multiple twins and step twin boundaries with a density about 1015 m−2 were frequently observed in the films. It appears there are tin interstitials at step twin boundaries and, hence, electronic donors associated with the interstitials.