Effect of substrate resistivity on switching noise in on-chip power distribution networks

Effect of substrate resistivity on switching noise in on-chip power distribution networks
复制标题

衬底电阻率对片上配电网络开关噪声的影响

DOI：
10.1109/epep.2003.1249994
复制
发表时间：
2003
期刊：
Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)
影响因子：
--
通讯作者：
D. O'Connor
D. O'Connor
中科院分区：
--
文献类型：
--
作者：
J. Mao;Madhavan Swaminathan;J. Libous;D. O'Connor

文献摘要

被引文献

相似文献

研究了片上配电网络(PDN)中衬底损耗对同步开关噪声(SSN)的影响。采用保角变换和基于一阶德拜近似的时域有限差分法(FDTD)分别用于频率相关参数的模型提取和时域仿真。本文量化了基片损耗对电源噪声的重要性。
This paper describes the effect of substrate loss on simultaneous switching noise (SSN) in on-chip power distribution networks (PDN). Conformal mapping and first-order Debye approximation based Finite Difference Time Domain (FDTD) have been used for model extraction and time domain simulation with frequency dependent parameters, respectively. The importance of substrate loss on power supply noise has been quantified in this paper.