A sampling oscilloscope macro toward feedback physical design methodology
A sampling oscilloscope macro toward feedback physical design methodology
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面向反馈物理设计方法的采样示波器宏
DOI：
10.1109/vlsic.2004.1346572
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发表时间：
2004
期刊：
影响因子：
--
通讯作者：
M. Mizuno
中科院分区：
文献类型：
--
作者：
M. Takamiya;M. Mizuno
已经开发出一种采样示波器宏，可以轻松嵌入到现场实际运行的 LSI 中，以实现反馈物理设计方法的实际使用。该宏具有 (1) 高速输入隔离比较器，用于测量 GHz 数字 LSI 上的信号；(2) 电压范围转换器，用于在 1V 电源电压下将输入范围扩大至 2V；(3) D/A 转换器，用于消除宏使用模拟 I/O；(4) 片上电源噪声滤波器，用于消除对专用电源的需要；(5) 嵌入式时钟发生器，用于消除对专用时钟信号的需要。通过使用宏，世界上首次测量了由片上电感效应引起的下冲波形。
A sampling oscilloscope macro which is easily embedded in an actually operating LSI in the field has been developed to enable practical use of the feedback physical design methodology. The macro features (1) a high-speed input-isolated comparator to measure signals on GHz-digital-LSIs, (2) a voltage-range converter to widen the input range to 2 V at a 1-V supply voltage, (3) D/A converters to eliminate the use of analog I/O for the macro, (4) an on-chip power supply noise filter to eliminate the need for a dedicated power supply, and (5) an embedded clock generator to eliminate the need for a dedicated clock signal. By using the macro, the world's first measurement of an undershooting waveform caused by an on-chip inductive effect has been demonstrated.