Analysis of thickness modulation in GaAs/GaAsP strained superlattice by TEM observation
Analysis of thickness modulation in GaAs/GaAsP strained superlattice by TEM observation
复制标题
DOI：
10.1016/j.jcrysgro.2012.05.017
复制
发表时间：
2012-08
影响因子：
1.8
通讯作者：
X. Jin;H. Nakahara;K. Saitoh;T. Saka;T. Ujihara;N. Tanaka;Y. Takeda
中科院分区：
文献类型：
--
作者：
X. Jin;H. Nakahara;K. Saitoh;T. Saka;T. Ujihara;N. Tanaka;Y. Takeda
