High-fidelity simultaneous detection of a trapped-ion qubit register
High-fidelity simultaneous detection of a trapped-ion qubit register
复制标题
捕获离子量子位寄存器的高保真同步检测
DOI：
10.1103/physreva.103.062614
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发表时间：
2021
影响因子：
2.9
通讯作者：
Blinov, Boris B.
中科院分区：
文献类型：
--
作者：
Zhukas, Liudmila A.;Svihra, Peter;Nomerotski, Andrei;Blinov, Boris B.
量子比特态检测是量子计算的重要组成部分。随着量子寄存器中量子比特数的增加，需要保持高保真检测以准确测量多量子比特态。在这里，我们给出了高保真探测多量子比特俘获离子寄存器的实验演示，其平均单量子比特检测误差为4.2(1.5)ppm，四量子比特状态检测误差为17(2)ppm，受量子比特衰变寿命的限制，具有快速数据采集、良好的时空分辨率和低仪器串扰的单光子敏感相机。
Qubit state detection is an important part of a quantum computation. As the number of qubits in a quantum register increases, it is necessary to maintain high-fidelity detection to accurately measure the multiqubit state. Here we present experimental demonstration of high-fidelity detection of a multiqubit trapped-ion register with an average single-qubit detection error of 4.2(1.5) ppm and a four-qubit state detection error of 17(2) ppm, limited by the decay lifetime of the qubit, using a single-photon-sensitive camera with fast data collection, excellent temporal and spatial resolution, and low instrumental crosstalk.