DOUBLE CRYSTAL DIFFRACTOMETRY FOR THE CHARACTERIZATION OF TARGETS FOR LASER FUSION EXPERIMENTS
DOUBLE CRYSTAL DIFFRACTOMETRY FOR THE CHARACTERIZATION OF TARGETS FOR LASER FUSION EXPERIMENTS
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DOI：
10.1002/crat.19800150812
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发表时间：
1980-01-01
期刊：
影响因子：
--
通讯作者：
ZAUMSEIL, P
中科院分区：
文献类型：
--
作者：
FORSTER, E;GOETZ, K;ZAUMSEIL, P
介绍了双晶衍射仪在X射线纹影形貌图制作中的应用。实验安排的基础上优化的波动光学描述的研究壳靶激光聚变实验。在0.01 ... 0.1 μm的壁厚测量时所达到的精度取决于壁材料的系列和评估的努力，满足等离子体物理要求。这为双晶衍射仪开辟了一个重要的新应用领域。
The application of a double‐crystal diffractometer for the production of X‐ray Schlieren topographs is described. The experimental arrangement is optimized on the basis of a wave‐optical description for the investigation of shell targets for laser fusion experiments. The accuracies achieved at the wall thickness measurement of 0.01 … 0.1 μm depending on the series of wall materials and the effort of evaluation fulfil the plasma physical requirements. This opens an important new field of application for the double‐crystal diffractometer.