Subwavelength imaging based on frequency scanning
Subwavelength imaging based on frequency scanning
复制标题
基于频率扫描的亚波长成像
DOI：
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发表时间：
2008
期刊：
影响因子：
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通讯作者：
S. Tretyakov
中科院分区：
文献类型：
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作者：
S. Maslovski;P. Alitalo;S. Tretyakov
考虑了基于频率扫描的亚波长成像的新原理。结果表明，可以通过在谐振阵列模式的整个频带上进行频率扫描来重建激励亚波长尺寸谐振粒子阵列（或耦合阵列）的外部场的空间轮廓。在扫描期间，测量并存储一个或最多两个点的近场值就足够了。扫描后，可以通过简单的后处理重建近场分布。所提出的近场显微镜没有移动部件。
A new principle of subwavelength imaging based on frequency scanning is considered. It is shown that it is possible to reconstruct the spatial profile of an external field exciting an array (or coupled arrays) of subwavelength-sized resonant particles with a frequency scan over the whole band of resonating array modes. During the scan it is enough to measure and store the values of the near field at one or at most two points. After the scan the distribution of the near field can be reconstructed with simple postprocessing. The proposed near-field microscope has no moving parts.