Tunneling through a multigrain system: Deducing sample topology from nonlinear conductance
Tunneling through a multigrain system: Deducing sample topology from nonlinear conductance
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DOI：
10.1103/physrevb.65.125312
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发表时间：
2002-03-15
影响因子：
3.7
通讯作者：
Kubatkin, SE
中科院分区：
文献类型：
--
作者：
Danilov, AV;Golubev, DS;Kubatkin, SE
我们研究了通过一个系统的几个晶粒连接隧道链接的电流传输。在正统模型的框架下，给出了任意连通的具有共享门的双粒子系统的精确解。结果是广义的多晶粒系统具有强烈不同的隧穿电阻。我们分析了大规模的非线性电导，并演示了如何从光谱图（差分电导与栅极偏置图）中明确推导出样品拓扑结构。我们目前的实验数据的多晶粒样品和重建的样品拓扑结构。一个简单的选择规则，制定区分样品的光谱模式免费从虚假的干扰所造成的一些颗粒附近的充电。作为一个例子，我们证明了实验数据中的光谱图案，这不能归因于耦合到额外的晶粒中的额外的峰。该方法可用于判断样品的拓扑结构时，它不能保证由制造和直接成像是不可能的。
We study a current transport through a system of a few grains connected with tunneling links. The exact solution is given for an arbitrarily connected double-grain system with a shared gate in the framework of the orthodox model. The result is generalized for multigrain systems with strongly different tunneling resistances. We analyze the large-scale nonlinear conductance and demonstrate how the sample topology can be unambiguously deduced from the spectroscopy pattern (differential conductance versus gate-bias plot). We present experimental data for a multigrain sample and reconstruct the sample topology. A simple selection rule is formulated to distinguish samples with spectral patterns free from spurious disturbance caused by recharging of some grains nearby. As an example, we demonstrate experimental data with additional peaks in the spectroscopy pattern, which cannot be attributed to coupling to additional grains. The approach can be used to judge the sample topology when it is not guaranteed by fabrication and direct imaging is not possible.