Kähler-Einstein metrics on complex surfaces withC1>0

Kähler-Einstein metrics on complex surfaces withC1>0
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C1>0 复杂表面上的 Kähler-Einstein 度量

DOI:
10.1007/bf01217685
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发表时间:
1987
影响因子:
2.4
通讯作者:
S. Yau
S. Yau
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
G. Tian;S. Yau

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本文利用分支覆盖、势估计和某些类型的正d-闭(1,1)流的Lelong数等,给出了文[T]中定义的全纯不变量α(M)的下界的各种估计,并将这些估计应用于C_1>0的复曲面上的Kähler-Einstein度量,特别地,证明了在任意微分型流形上存在C1>0的Kähler-Einstein结构 $$CP^2 \# \overline {nCP^2 }(3 \leqq n \leqq 8)$$ .
AbstractVarious estimates of the lower bound of the holomorphic invariant α(M), defined in [T], are given here by using branched coverings, potential estimates and Lelong numbers of positive,d-closed (1, 1) currents of certain type, etc. These estimates are then applied to produce Kähler-Einstein metrics on complex surfaces withC1>0, in particular, we prove that there are Kähler-Einstein structures withC1>0 on any manifold of differential type $$CP^2 \# \overline {nCP^2 } (3 \leqq n \leqq 8)$$ .