Chemical solution deposition of lanthanum zirconate buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates for coated-conductor fabrication
Chemical solution deposition of lanthanum zirconate buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates for coated-conductor fabrication
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化学%20溶液%20沉积%20of%20镧%20锆酸盐%20缓冲剂%20层%20on%20双轴%20纹理%20Ni-1.7%%20Fe-3%%20W%20合金%20基材%20用于%20涂层导体%20制造
DOI：
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发表时间：
2002
期刊：
影响因子：
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通讯作者：
D. Christen
中科院分区：
文献类型：
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作者：
S. Sathyamurthy;M. Paranthaman;T. Aytug;B. Kang;P. M. Martin;A. Goyal;D. Kroeger;D. Christen
本文研究了用连续卷对卷浸涂装置在双轴织构Ni-1.7%Fe-3%W合金基体上溶胶-凝胶法制备La_2Zr_2O_7（LZO）缓冲层的工艺。外延生长的LZO薄膜具有较强的立方织构和均匀的微结构。研究了提高退火速度对薄膜织构、显微结构和碳含量的影响。在LZO薄膜上，用射频溅射法制备了氧化钇稳定的氧化锆和氧化铈（CeO_2）外延层，然后用脉冲激光沉积法制备了YBa_2Cu_3O_ x（YBCO）薄膜。在77 K和0.5 T下，薄膜的临界电流密度（J _c）分别为1.9 MA/cm ~ 2和0.34 MA/cm ~ 2。这些值与在全真空沉积缓冲层上沉积的YBCO膜上获得的值相当，并且是使用溶液种子层获得的最高值。
Sol-gel processing of La_2Zr_2O_7 (LZO) buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates using a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. The effects of increasing the annealing speed on the texture, microstructure, and carbon content retained in the film were studied. On top of the LZO films, epitaxial layers of yttria-stabilized zirconia and Ceria (CeO_2) were deposited using rf sputtering, and YBa_2Cu_3O_ x (YBCO) films were then deposited using pulsed laser deposition. Critical current densities ( J _c) of 1.9 MA/cm_2 at 77 K and self-field and 0.34 MA/cm_2at 77 K and 0.5 T have been obtained on these films. These values are comparable to those obtained on YBCO films deposited on all-vacuum deposited buffer layers and the highest ever obtained using solution seed layers.