W.Gao, S.Kiyono and T.Sugawara: "Nano-metrology of roundness error and spindle error" Proceedings of ASPE 1996 Annual Meeting. 163-166 (1996)
W.Gao, S.Kiyono and T.Sugawara: "Nano-metrology of roundness error and spindle error" Proceedings of ASPE 1996 Annual Meeting. 163-166 (1996)
复制标题
W.Gao、S.Kiyono 和 T.Sukawara:“圆度误差和主轴误差的纳米计量学”ASPE 1996 年年会论文集。
DOI:
--
复制
发表时间:
--
期刊:
影响因子:
--
通讯作者:
中科院分区:
文献类型:
--
作者: