Surface morphologies of SnO2(110)
Surface morphologies of SnO2(110)
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DOI:
10.1016/s0039-6028(03)00357-1
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发表时间:
2003-04-10
期刊:
影响因子:
1.9
通讯作者:
Diebold, U
中科院分区:
文献类型:
--
作者:
Batzill, M;Katsiev, K;Diebold, U
Scanning tunneling microscopy (STM), ion scattering spectroscopy (ISS), and low energy electron diffraction (LEED) was used to investigate the surface morphology of SnO2(110) for different preparation conditions. Annealing in 10(-3) mbar oxygen results in a 1 x 1 diffraction pattern. Such surfaces exhibit terraces separated predominantly by straight step edges along low index crystallographic directions. The terraces exhibit a high density of defects. Annealing to 8 10 K results in the loss of surface oxygen but the surface retains a 1 x 1 periodicity. Steps of less than monolayer-height, however, indicate that a significant reordering of the surface atoms occurs already at this temperature. Annealing to higher temperature or preparation of the surface by sputtering and vacuum annealing always results in a superstructure in the diffraction pattern and a low [O]/[Sn] ratio in ISS. For annealing temperatures between 920 and 1050 K co-existence of c(2 x 2) and 4 x 1 reconstructed domains is observed. In this regime small adislands are always present at the surface; extended terraces were imaged by STM with a 4 x 1 periodicity. This implies that the c(2 x 2)structure is associated with adislands at the surface. Annealing to 1100 K resulted in the formation of a 4 x 1 surface only. This surface exhibits terraces with meandering step edges and antiphase domain boundaries of the 4 x 1 surface structure. A new model for this reconstruction is proposed including Sn atoms occupying interstitial surface sites. Annealing to 1180 K results in the fragmentation of the 4 x 1 structure and the surface looses its long-range order. This causes a 1 x 1 LEED pattern originating from the underlying substrate. Surface undulations with sub-interlayer step heights are explained by the frequent presence of stacking faults and other bulk defects that are also accompanied by variations in the electronic structure due to a locally altered Sn/O stoichiometry. (C) 2003 Elsevier Science B.V. All rights reserved.