Method for Assembling Nanosamples and a Cantilever for Dynamic Cantilever Magnetometry
Method for Assembling Nanosamples and a Cantilever for Dynamic Cantilever Magnetometry
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DOI：
10.1103/physrevapplied.11.054007
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发表时间：
2019-05
影响因子：
4.6
通讯作者：
Feng Xu;Shanshan Guo;Yang Yu;Ning Wang;L. Zou;Baomin Wang;Run‐Wei Li;Fei Xue
中科院分区：
文献类型：
--
作者：
Feng Xu;Shanshan Guo;Yang Yu;Ning Wang;L. Zou;Baomin Wang;Run‐Wei Li;Fei Xue
动态悬臂梁磁测量(DCM)提供了独特的能力和灵敏度来探测单个微观样品的磁化过程。样品的组装和悬臂以及DCM的灵敏度对于纳米磁学研究中的应用非常重要；到目前为止，DCM主要用于线状样品，因为还没有通用的样品组装方法。为了填补这一空白，本研究提出了一种方法，使用双聚焦离子束、扫描电子显微镜和纳米操纵器，允许将DCM扩展到研究任意形状的单个纳米结构的磁性。
Dynamic cantilever magnetometry (DCM) offers unique capabilities and sensitivity to probe magnetization processes in individual microscopic samples. Assembling the samples and a cantilever and the sensitivity of DCM are important for applications in nanomagnetism research; so far, DCM has been used primarily on wire-shaped samples, because no universal method for sample assembly has been available. To fill that gap, this study presents a method, using dual focused ion beams, a scanning electron microscope, and a nanomanipulator, that allows the extension of DCM to study the magnetic properties of individual nanostructures of arbitrary shape.