Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron
Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron
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DOI：
10.1016/j.nimb.2007.01.280
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发表时间：
2007-07-01
影响因子：
1.3
通讯作者：
Kamiya, Tomihiro
中科院分区：
文献类型：
--
作者：
Oikawa, Masakazu;Satoh, Takahiro;Kamiya, Tomihiro
在日本高崎原子能公司TIARA设施中，对聚焦高能重离子微束系统的空间分辨率和对目标的命中精度进行了测试。成功地从JAEA AVF回旋加速器（K = 110）中提取了一束260 MeV的Ne-20（7+）离子束，其动量扩散（δ P/P = δ）是目前最小的。利用微束透镜系统对微束进行聚焦，利用Cu栅格的二次电子图像测量了260 MeV Ne-20（7+）微束的空间分辨率，并利用单离子撞击CR-39薄膜的方法估计了微束的撞击精度。从这两种测量方法中，空间分辨率和命中精度都在小于1 μ m的情况下进行了评估。(c) 2007 Elsevier B.V.。
Performance of a focusing high-energy heavy ion microbeam system in TIARA facility of JAEA Takasaki was tested for the spatial resolution and for the hitting accuracy at a target. A 260 MeV Ne-20(7+) ion beam was successfully extracted from the JAEA AVF cyclotron (K = 110) with the smallest momentum spread (Delta P/P = delta) at present. The beam was focused by the microbeam lens system, and a spatial resolution of 260 MeV Ne-20(7+) microbeam was measured from a secondary electron image of a Cu grid which had sharp edges, and the hitting accuracy was estimated using single ion hitting onto a CR-39 film. From those two methods of measurement, both the spatial resolution and the hitting accuracy were evaluated at less than 1 mu m. (c) 2007 Elsevier B.V. All rights reserved.