A Method to Generate a Very Low Distortion, High Frequency Sine Waveform Using an AWG
A Method to Generate a Very Low Distortion, High Frequency Sine Waveform Using an AWG
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一种使用 AWG 生成极低失真、高频正弦波形的方法
DOI：
10.1109/test.2008.4700607
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发表时间：
2008
期刊：
影响因子：
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通讯作者：
A. Maeda
中科院分区：
文献类型：
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作者：
A. Maeda
近年来，在混合信号片上系统（soc）中嵌入的模数转换器（adc）的采样频率和分辨率不断提高。因此，测试这些adc的动态性能对ATE来说是一个挑战，因为模拟信号源仪器，通常是任意波形发生器（AWG），必须产生输出频率在30 MHz到100 MHz左右的干净正弦波形。本文介绍了一种方法，产生一个非常低的失真正弦波形，远远超过所使用的AWG的规格，通过应用反相分量的失真。实际实验表明，在50 MHz AWG输出频率下，该方法可将二阶谐波失真降低31 dB，将三阶谐波失真降低25 dB。使用这种方法，混合信号soc和高频、高分辨率adc的动态性能测试可以使用传统的低成本AWG完成。
Recently, the sampling frequency and resolution of analog-to-digital converters (ADCs) embedded in mixed signal system-on-chips (SOCs) has been increasing. As a result, testing the dynamic performance of these ADCs is a challenge for ATE because the analog signal source instrument, typically an arbitrary waveform generator (AWG), must generate a clean sine waveform with an output frequency of around 30 MHz to 100 MHz. This paper introduces a method to generate a very low distortion sine waveform, which far exceeds the specification of the AWG used, by applying a reverse phase component to the distortion. Actual experiments show this method reduces the 2nd order harmonic distortion by 31 dB and 3rd order harmonic distortion by 25 dB at a 50 MHz AWG output frequency. With this method, testing the dynamic performance of mixed signal SOCs and high frequency, high resolution ADCs can be accomplished using a legacy, low cost AWG.