THE STABILITY OF RADIALLY BOUNDED THIN FILMS

THE STABILITY OF RADIALLY BOUNDED THIN FILMS
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径向束缚薄膜的稳定性

DOI：
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发表时间：
1975
期刊：
影响因子：
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通讯作者：
G. Homsy
G. Homsy
中科院分区：
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文献类型：
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作者：
R. J. Gumerman;G. Homsy

文献摘要

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摘要 在薄膜表面初始为平面且平行的情况下，检查了径向有界减薄自由薄膜的线性稳定性。通过润滑理论计算的二维随时间变化的排水流构成了基础状态。该流相对于轴对称静脉曲张扰动的线性稳定性在准静态近似中进行处理。对于薄膜，分散的伦敦-范德华吸引力在确定断裂临界厚度方面发挥着关键作用，结果以临界薄膜纵横比的预测形式呈现，作为两个无量纲组的函数，无量纲组是薄膜上重要的物理化学力的比率。预测的临界厚度与有限的可用实验数据非常吻合。
Abstract The linear stability of radially bounded thinning free films is examined for the case in which the surfaces of the film are initially plane and parallel. The two-dimensional time-dependent drainage flow computed by lubrication theory constitutes the base state. The linear stability of this flow with respect to axially symmetric varicose disturbance is treated in the quasistatic approximation. For thin films, disperse London-van der Waals attractive forces play a key role in determining the critical thickness at rupture, and the results are presented as predictions of critical film aspect ratio as a function of two dimensionless groups which are ratios of the important physical-chemical forces on the film. Predicted critical thicknesses are seen to agree well with the limited available experimental data.