Study of poly(vinyl chloride) interfaces using slow positron beams
Study of poly(vinyl chloride) interfaces using slow positron beams
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DOI：
10.1002/app.23801
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发表时间：
2006-06
影响因子：
3
通讯作者：
N. Mostafa
中科院分区：
文献类型：
--
作者：
N. Mostafa
用元素分析和X射线荧光分析测定了绝缘子和护套聚氯乙烯(PVC)样品的化学成分。此外，用差示扫描量热法(DSC)测定了它们的玻璃化转变温度(Tg)和熔点。用多普勒展宽能谱结合慢正电子束技术研究了添加剂对两个被考察样品以及对纯PVC样品的影响。在所有样品中都观察到S参数随正电子注入能量和深度从表面到本体的显著变化。S参数在很低的正电子能量(<；1keV)下增大，饱和到约6keV，然后减小到27keV。S参数(ΔS)的变化幅度是自由体积缺陷分布宽度的变化，在添加剂较多的夹套聚氯乙烯样品中，自由体积缺陷分布的广度大于绝缘子聚氯乙烯样品。#2006威利期刊公司《应用波利姆科学》100：3789-3793,2006
Elemental and X-ray fluorescence analyses were performed to determine the chemical compositions of insulator and jacket poly(vinyl chloride) (PVC) samples. In addition, differential scanning calorimetry (DSC) measurement was performed to determine their glass-transition temperatures (Tg) and melting points. The effect of additives on the two investigated samples, as well as on a pure PVC sample, was studied using Doppler-broadening energy spectra coupled with the slow positron beam technique. Significant variation in the S parameter as a function of positron implantation energy and depth from the surface to the bulk was observed in all samples. The S parameter increased at a very low positron energy (< 1 keV), saturated to about 6 keV, and then decreased up to 27 keV. The S parameter (ΔS) changed to the extent of the change in the breadth of the distribution of free-volume defects, which was larger in the jacket PVC sample, which had more additives, than in the insulator PVC sample. © 2006 Wiley Periodicals, Inc. J Appl Polym Sci 100: 3789–3793, 2006