A Wide-Range Variation-Resilient Physically Unclonable Function in 28 nm
A Wide-Range Variation-Resilient Physically Unclonable Function in 28 nm
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28 nm 范围内抗大范围变化的物理不可克隆函数
DOI：
10.1109/jssc.2019.2942374
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发表时间：
2020
影响因子：
5.4
通讯作者：
Tsung
中科院分区：
文献类型：
--
作者：
Zhen;Hao Wei;Tsung
本文提出了一个广泛的、可变弹性的物理不可克隆函数（PUF），以提供可靠的安全原语解决方案。所提出的基于环形振荡器的PUF采用多种稳定技术来保持环境变化下的鲁棒性。所提出的PUF设计使用具有调整信号斜率的延迟单元拓扑来放大设备可变性对延迟不匹配的影响。此外，采用在线校准系统提取现场PUF延迟信息并重新配置级互连，进一步扩大了频率失配，提高了稳定性。采用28纳米CMOS技术制作的原型机的测量结果表明，所提出的PUF设计在广泛的工作条件下具有高度稳定的性能，在0.4-1.3 V和- 40至125°C的最坏情况下误码率（BER）为0.55%。测量的误码率对电源电压（0.0546%/0.1 V）和温度（0.0052%/10°C）的灵敏度分别比目前的结果提高了2.38倍和28.84倍。
This article presents a wide-range, variation-resilient physically unclonable function (PUF) to provide a reliable security primitive solution. The proposed ring oscillator-based PUF employs several stabilization techniques to maintain robustness under environmental variations. The proposed PUF design uses a delay cell topology with an adjusted signal slope to amplify the impact of device variability on delay mismatch. Moreover, an online calibration system that extracts in situ PUF delay information and re-configures stage interconnects is employed to further enlarge frequency mismatch and improve stability. Measurement results from a prototype fabricated in a 28-nm CMOS technology show that the proposed PUF design achieves a highly stable performance over a wide range of operating conditions, with a worst case bit error rate (BER) of 0.55% across 0.4–1.3 V and −40 to 125 °C. The measured BER sensitivities to supply voltage (0.0546%/0.1 V) and temperature (0.0052%/10 °C) demonstrate the stability improvements of 2.38 and 28.84 times, respectively, when compared with the state-of-the-art results.