Structural Origin of Reversible Li Insertion in Guest-Free, Type-II Silicon Clathrates
Structural Origin of Reversible Li Insertion in Guest-Free, Type-II Silicon Clathrates
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DOI:
10.1002/aesr.202000114
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发表时间:
2021-05-01
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影响因子:
--
通讯作者:
Chan, Candace K.
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文献类型:
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作者:
Dopilka, Andrew;Weller, J. Mark;Chan, Candace K.
The guest-free, type-II Si clathrate (Si-136) is an open cage polymorph of Si with structural features amenable to electrochemical Li storage. However, the detailed mechanism for reversible Li insertion and migration within the vacant cages of Si-136 is not established. Herein, X-ray characterization and density functional theory (DFT) calculations are used to understand the structural origin of electrochemical Li insertion into the type-II clathrate structure. At low Li content, instead of alloying with Si, topotactic Li insertion into the empty cages occurs at approximate to 0.3V versus Li/Li+ with a capacity of approximate to 231mAhg(-1) (corresponding to composition Li32Si136). A synchrotron powder X-ray diffraction analysis of electrodes after lithiation shows evidence of Li occupation within the Si-20 and Si-28 cages and a volume expansion of 0.22%, which is corroborated by DFT calculations. Nudged elastic band calculations suggest a low barrier (0.2eV) for Li migration through interconnected Si-28 cages, whereas there is a higher barrier for Li migration into Si-20 cages (2.0eV). However, if Li is present in a neighboring cage, a cooperative migration pathway with a barrier of 0.65eV is possible. The results show that the type-II Si clathrate displays unique electrochemical properties for potential applications as Li-ion battery anodes.